Invention Grant
- Patent Title: Work-piece defect inspection via optical images and CT images
-
Application No.: US14957662Application Date: 2015-12-03
-
Publication No.: US09721334B2Publication Date: 2017-08-01
- Inventor: Boliang Chen , Min Gong , Dong Sheng Li , Junchi Yan , Chao Zhang , Wei Peng Zhang
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent L. Jeffrey Kelly
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06K9/62 ; H04N5/232

Abstract:
A computer-implemented method, computer program product, and system for detecting work-piece defects. The computer-implemented method may include: receiving a first image of a training work-piece captured using a non-destructive imaging process and a second image of the training work-piece captured using a destructive imaging process; receiving an image of a work-piece captured using a non-destructive imaging process, wherein the work-piece is substantially similar to the training work-piece, and the non-destructive imaging process used to capture the work-piece is substantially similar to the non-destructive imaging process used to capture the training work-piece; matching the image of the work-piece to the first image of the training work-piece; and enhancing the image of the work-piece using the second image of the training work-piece, in response to the image of the work-piece matching the first image of the training work-piece.
Public/Granted literature
- US20170161884A1 WORK-PIECE DEFECT INSPECTION VIA OPTICAL IMAGES AND CT IMAGES Public/Granted day:2017-06-08
Information query