Invention Grant
- Patent Title: Method and system of determining a location of a line fault of a panel
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Application No.: US14800806Application Date: 2015-07-16
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Publication No.: US09697757B2Publication Date: 2017-07-04
- Inventor: Yu Ai
- Applicant: BOE TECHNOLOGY GROUP CO., LTD. , Hefei Xinsheng Optoelectronics Technology Co., Ltd.
- Applicant Address: CN Beijing CN Anhui
- Assignee: Boe Technoogy Group Co., Ltd.,Hefei Xinsheng Optoelectronics Technology Co., Ltd.
- Current Assignee: Boe Technoogy Group Co., Ltd.,Hefei Xinsheng Optoelectronics Technology Co., Ltd.
- Current Assignee Address: CN Beijing CN Anhui
- Agency: Calfee, Halter & Griswold LLP
- Priority: CN201510067555 20150209
- Main IPC: G01R31/08
- IPC: G01R31/08 ; G09G3/00 ; G09G3/36

Abstract:
The present disclosure discloses a method and system of determining a location of a line fault of a panel. The method comprises: connecting a front end point of a metal wire that is determined to have suffered the line fault to a probe of a test instrument, the other probe of the test instrument being connected to a common electrode wire; performing a fusing-off processing on the metal wire according to a preset rule; and determining the location of the line fault of the metal wire based on a variation in the readings from the test instrument upon the fusing-off of the metal wire. The system comprises: a test instrument, one probe of which being connected to a front end point of a metal wire that is determined to have suffered the line fault, the other probe of which being connected to a common electrode wire; and a laser for performing a fusing-off processing on the metal wire. The short circuit of the metal wire may be localized at a pixel cell level using the method and system according to the embodiments of the present disclosure.
Public/Granted literature
- US20160231374A1 METHOD AND SYSTEM OF DETERMINING A LOCATION OF A LINE FAULT OF A PANEL Public/Granted day:2016-08-11
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