Invention Grant
- Patent Title: Scanning laser microscope
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Application No.: US14560963Application Date: 2014-12-04
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Publication No.: US09696532B2Publication Date: 2017-07-04
- Inventor: Hisao Kitagawa
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz & Volek PC
- Priority: JP2014-008573 20140121
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G02B21/16 ; G01N21/64

Abstract:
An image having an expected superresolution effect is created in a straightforward manner and with superior precision. The invention provides a scanning laser microscope including a scanner that scans a laser beam emitted from an Ar laser device on a specimen; an objective lens that radiates the laser beam scanned by the scanner onto the specimen and that collects return light coming from the specimen; a detector array that has a plurality of minute detector elements arrayed at a position that is optically conjugate with the focal position of the objective lens; and a superresolution calculating portion that calculates a center position of a spot of the return light that is incident on the detector array on the basis of a light intensity signal output from each of the minute detector elements in the detector array.
Public/Granted literature
- US20150205086A1 SCANNING LASER MICROSCOPE Public/Granted day:2015-07-23
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