A method and system for reducing leakage current in a testing circuit are provided. Embodiments include a testing circuit that includes a digital buffer that includes a first transistor operatively coupled to a second transistor, where a drain of the first transistor is operatively coupled to a source of the second transistor. The second transistor is switched into cutoff mode. The digital buffer also includes a reference voltage generation circuit. The reference voltage generation circuit is operatively connected to the drain of the first transistor and the source of the second transistor. The reference voltage generation circuit is configured to reduce the leakage current in the digital buffer.