A guided approach device for guiding together a first device (handler or tester) and a second device (including a test head for electronic components), including a latching device with a cylindrical pin socket for holding and fixing a front end of a catch pin. The latching device is connected to a linear displacement device such that the cylindrical pin socket may be displaced in a linear direction at least a short distance corresponding to a multiple of a length of a leading section of the catch pin, which may be inserted into the pin socket. Additionally or alternatively, the latching device is connected to a linear displacement device such that the latching element, a spring element and the pin socket may be displaced, with the catch pin engaged, in a linear direction by the linear displacement device, so that the first and second devices maybe moved relative to one another.