- Patent Title: Temperature detection circuit and temperature measurement circuit
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Application No.: US14551149Application Date: 2014-11-24
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Publication No.: US09671293B2Publication Date: 2017-06-06
- Inventor: Kazuhiro Kamiya , Kimitoshi Niratsuka
- Applicant: Spansion LLC
- Applicant Address: US CA San Jose
- Assignee: Cypress Semiconductor Corporation
- Current Assignee: Cypress Semiconductor Corporation
- Current Assignee Address: US CA San Jose
- Main IPC: G01K3/00
- IPC: G01K3/00 ; G01K1/02

Abstract:
A temperature detection circuit and a temperature measurement circuit capable of detecting and measuring temperatures precisely are disclosed. The temperature detection circuit includes n temperature detectors (n is an integer of 2 or more), each of the temperature detectors being configured to output a detection signal of high level when a temperature of an object reaches a first value, and a temperature determination part configured to determine whether or not the temperature of the object has reached a second value based on a count of high-level detection signals.
Public/Granted literature
- US20160146675A1 TEMPERATURE DETECTION CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT Public/Granted day:2016-05-26
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