Invention Grant
- Patent Title: Method for manufacturing semiconductor device
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Application No.: US15046369Application Date: 2016-02-17
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Publication No.: US09647027B2Publication Date: 2017-05-09
- Inventor: Hiroaki Sano , Yuto Nozaki
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon U.S.A. Inc., IP Division
- Priority: JP2015-032001 20150220
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L27/146

Abstract:
An inorganic film is dry-etched using plasma with a photoresist pattern serving as a mask, and an organic film is dry-etched using plasma with the photoresist pattern serving as a mask without exposing a pad electrode. The photoresist pattern is removed using a stripping solution. After the removal of the photoresist pattern using a stripping solution, the organic film is etched to expose the pad electrode with the inorganic film that remains after the dry etching of the inorganic film using plasma serving as a mask.
Public/Granted literature
- US20160247853A1 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2016-08-25
Information query
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