Invention Grant
- Patent Title: Line width error obtaining method, line width error obtaining apparatus, and inspection system
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Application No.: US15051744Application Date: 2016-02-24
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Publication No.: US09646374B2Publication Date: 2017-05-09
- Inventor: Hideaki Hashimoto , Hideki Nukada , Kazuhiko Inoue
- Applicant: NuFlare Technology, Inc.
- Applicant Address: JP Yokohama
- Assignee: NuFlare Technology, Inc.
- Current Assignee: NuFlare Technology, Inc.
- Current Assignee Address: JP Yokohama
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2015-035796 20150225
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00

Abstract:
Optical image data is acquired by irradiating a pattern with light emitted from a light source. A threshold value is specified by internally dividing a minimum value and a maximum value of a signal amount of reference image data by a division ratio. A position corresponding to a signal amount of a threshold value is determined as an edge of a pattern of the reference image data. A position of a signal amount equal to the threshold value is determined as an edge of the pattern of the optical image data. A line width error is obtained as a difference between a first line width of the optical image data and a second line width of the reference image data. A new threshold value is specified in the case of fluctuation of a light quantity of the light source or decrease of a contrast value of the optical image data.
Public/Granted literature
- US20160247267A1 LINE WIDTH ERROR OBTAINING METHOD, LINE WIDTH ERROR OBTAINING APPARATUS, AND INSPECTION SYSTEM Public/Granted day:2016-08-25
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