Invention Grant
- Patent Title: Method for automatically selecting test parameters of an image inspection system and image inspection system for implementing the method
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Application No.: US14674142Application Date: 2015-03-31
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Publication No.: US09641700B2Publication Date: 2017-05-02
- Inventor: Frank Schumann , Winfried Berg
- Applicant: HEIDELBERGER DRUCKMASCHINEN AG
- Applicant Address: DE Heidelberg
- Assignee: Heidelberger Druckmaschinen AG
- Current Assignee: Heidelberger Druckmaschinen AG
- Current Assignee Address: DE Heidelberg
- Agent Laurence A. Greenberg; Werner H. Stemer; Ralph E. Locher
- Priority: DE102014004557 20140331
- Main IPC: H04N1/00
- IPC: H04N1/00 ; G06T7/00

Abstract:
A method for automatically selecting test parameters for an image inspection system using a computer, includes digitizing a reference image or a scanned printed image to determine target values, categorizing the image elements that are present, determining tolerances for the target values based on the categorization, calculating the inspection sensitivity based on target values and the respective tolerances thereof, setting the parameters of the image inspection system based on the inspection sensitivity, and configuring the image inspection using these parameters. An image inspection system for implementing the method is also provided.
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