Invention Grant
- Patent Title: Analysis apparatus and analysis method
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Application No.: US14076973Application Date: 2013-11-11
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Publication No.: US09638729B2Publication Date: 2017-05-02
- Inventor: Hiroyuki Maekawa , Yoshihiro Nishimura , Seiji Morishita , Hisahiro Yamaoka , Takumi Hirakawa , Makoto Yonezawa
- Applicant: Lasertec Corporation
- Applicant Address: JP Yokohama, Kanagawa
- Assignee: LASERTEC CORPORATION
- Current Assignee: LASERTEC CORPORATION
- Current Assignee Address: JP Yokohama, Kanagawa
- Agency: Procopio, Cory, Hargreaves & Savitch LLP
- Priority: JP2012-250592 20121114
- Main IPC: G01R21/00
- IPC: G01R21/00 ; H01M10/04 ; H01M10/054 ; H01M10/44 ; H01M10/48 ; G01R31/36 ; H01M10/052

Abstract:
Provided are an analysis apparatus and an analysis method which are capable of recognizing a local state change of an internal structure of a secondary battery. The analysis apparatus includes: an observation cell that houses a secondary battery; a charging and discharging controller that controls charging and discharging of the secondary battery; an image pickup device that captures color images of the secondary battery at a predetermined time interval; and a charging and discharging data detection unit that acquires charging and discharging data on the secondary battery during charging and discharging. Color image signals output from the image pickup device and charging and discharging data signals output from the charging and discharging data detection unit are supplied to a signal processing device. The signal processing device outputs a unit that temporally links time-series color image signals and time-series charging and discharging data signals, and designated analysis data.
Public/Granted literature
- US20140136132A1 ANALYSIS APPARATUS AND ANALYSIS METHOD Public/Granted day:2014-05-15
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