Invention Grant
- Patent Title: ATE thermal overload detection and recovery techniques
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Application No.: US14703105Application Date: 2015-05-04
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Publication No.: US09638718B2Publication Date: 2017-05-02
- Inventor: Ralf Haefner , Claus Ploetz
- Applicant: Advantest Corporation
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Main IPC: G01R1/36
- IPC: G01R1/36 ; G01K7/00 ; G01R1/02 ; G01K13/00

Abstract:
A system including an automated test equipment (ATE) and an interface board. The interface board includes a temperature monitor that compares a sensor temperature to a predetermined temperature. The associated temperature sensor may be located near one or more selected components on the device under test or the interface board. If the sensor temperature exceeds the predetermined temperature the temperature monitor turns off one or more power supplies of the ATE.
Public/Granted literature
- US20160109485A1 ATE THERMAL OVERLOAD DETECTION AND RECOVERY TECHNIQUES Public/Granted day:2016-04-21
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