- Patent Title: Measurement apparatus and method of measuring signal light quality
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Application No.: US14687157Application Date: 2015-04-15
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Publication No.: US09638574B2Publication Date: 2017-05-02
- Inventor: Tomohiro Yamauchi , Shoichiro Oda
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2014-102516 20140516
- Main IPC: G01J1/44
- IPC: G01J1/44 ; G01J1/04 ; H04B10/079

Abstract:
There is provided a measurement apparatus of measuring signal light quality. The measurement apparatus may include: a tunable wavelength filter configured to be input signal lights having different power levels; a measure configured to measure an optical power level of light passing through the tunable wavelength filter; and a controller configured to calculate a non-linear noise component and a spontaneous emission component of a signal light based on the measured optical power levels, the optical power levels being measured at different transmission frequencies for each of the signal lights having the different power levels in response to a control of the transmission frequency of the tunable wavelength filter.
Public/Granted literature
- US20150330835A1 MEASUREMENT APPARATUS AND METHOD OF MEASURING SIGNAL LIGHT QUALITY Public/Granted day:2015-11-19
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