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US09589676B2 Semiconductor device and operating method thereof 有权
半导体器件及其操作方法

Semiconductor device and operating method thereof
Abstract:
A semiconductor device may include: a first latch configured to store data outputted from a memory cell during a first operation; and a fail detection circuit configured to detect a fail by comparing the data outputted from the memory cell to the data stored in the first latch through a second operation performed at a predetermined time after the first operation.
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