A semiconductor device may include: a fuse array including a plurality of fuses; a voltage generation unit suitable for generating a first measurement voltage having a preset level; and a measurement unit suitable for supplying the first measurement voltage to a sourcing node of the fuse array and a second measurement voltage, which is provided from an external through a first pad, to a sinking node of the fuse array, and outputting a current, which is caused by voltage difference between the first and second measurement voltages and passes through one or more of the multiple fuses, through the first pad.