Invention Grant
- Patent Title: Analysis apparatus, analysis method and analysis system
- Patent Title (中): 分析仪器，分析方法和分析系统
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Application No.: US13581152Application Date: 2011-02-01
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Publication No.: US09588210B2Publication Date: 2017-03-07
- Inventor: Masashi Tsukada , Yasuhide Kusaka
- Applicant: Masashi Tsukada , Yasuhide Kusaka
- Applicant Address: JP Kyoto
- Assignee: ARKRAY, Inc.
- Current Assignee: ARKRAY, Inc.
- Current Assignee Address: JP Kyoto
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JP2010-043102 20100226
- International Application: PCT/JP2011/052018 WO 20110201
- International Announcement: WO2011/105178 WO 20110901
- Main IPC: G01R35/00
- IPC: G01R35/00 ; A61B5/1473 ; A61B5/1486 ; G06F19/10 ; A61B5/1495
Abstract:
Provided is an analysis apparatus capable of acquiring a measurement result with high reliability that includes: a signal detection unit; a measuring unit; a first temperature detection unit; a second temperature detection unit; and a calculation unit.
Public/Granted literature
- US20130197847A1 Analysis Apparatus, Analysis Method and Analysis System Public/Granted day:2013-08-01
Information query
