Invention Grant
- Patent Title: Measurement apparatus and measurement method
- Patent Title (中): 测量仪器及测量方法
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Application No.: US14635044Application Date: 2015-03-02
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Publication No.: US09588043B2Publication Date: 2017-03-07
- Inventor: Takamasa Seto
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2014-049314 20140312
- Main IPC: G01N21/47
- IPC: G01N21/47 ; G01N21/55

Abstract:
A sensor unit photoelectrically converts received light to output image data. A lens unit condenses light reflected by an object surface to be measured on the sensor unit. A lens control unit controls a geometric condition of rays passing through the lens unit. The sensor unit and the lens control unit are controlled to acquire a multi-angular reflectance property in a neighborhood of a specular reflection direction of the object surface.
Public/Granted literature
- US20150260647A1 MEASUREMENT APPARATUS AND MEASUREMENT METHOD Public/Granted day:2015-09-17
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