Invention Grant
US09564588B2 Device for detecting surface plasmon and polarization by using topological insulator, method of manufacturing the device, and method of detecting surface plasmon and polarization
有权
使用拓扑绝缘子检测表面等离子体和极化的装置，制造器件的方法以及检测表面等离子体和极化的方法
- Patent Title: Device for detecting surface plasmon and polarization by using topological insulator, method of manufacturing the device, and method of detecting surface plasmon and polarization
- Patent Title (中): 使用拓扑绝缘子检测表面等离子体和极化的装置，制造器件的方法以及检测表面等离子体和极化的方法
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Application No.: US14275209Application Date: 2014-05-12
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Publication No.: US09564588B2Publication Date: 2017-02-07
- Inventor: Hee-jeong Jeong , Chang-won Lee , Sang-mo Cheon
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2013-0140894 20131119
- Main IPC: H01L49/00
- IPC: H01L49/00 ; H01L31/0232 ; H01L31/18 ; H01L31/032
Abstract:
A device for detecting a surface plasmon and polarization includes: a topological insulating layer formed on a substrate; first and second electrodes formed on the topological insulating layer; and a waveguide connected to the topological insulating layer between the first and second electrodes.
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