Invention Grant
- Patent Title: Substrate opening formation in semiconductor devices
- Patent Title (中): 半导体器件中的基板开口形成
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Application No.: US15154864Application Date: 2016-05-13
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Publication No.: US09564405B2Publication Date: 2017-02-07
- Inventor: Jerod F. Mason , Dylan Charles Bartle , David Scott Whitefield
- Applicant: SKYWORKS SOLUTIONS, INC.
- Applicant Address: US MA Woburn
- Assignee: Skyworks Solutions, Inc.
- Current Assignee: Skyworks Solutions, Inc.
- Current Assignee Address: US MA Woburn
- Agency: Chang & Hale LLP
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L23/00 ; H01L21/768 ; H01L29/06 ; H01L23/528 ; H01L21/683 ; H01L21/762 ; H01L29/78 ; H04B1/40

Abstract:
Radio-frequency (RF) devices are fabricated by providing a field-effect transistor (FET) formed over an oxide layer, forming one or more electrical connections to the FET, forming one or more dielectric layers over at least a portion of the electrical connections, electrically coupling an electrical element to the FET via the one or more electrical connections, disposing a handle wafer layer on at least a portion of the one or more dielectric layers, the handle wafer layer being at least partially over the electrical element; and removing at least a portion of the handle wafer layer to form an opening exposing at least a portion of the electrical element.
Public/Granted literature
- US20160336279A1 SUBSTRATE OPENING FORMATION IN SEMICONDUCTOR DEVICES Public/Granted day:2016-11-17
Information query
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