Invention Grant
- Patent Title: Contamination filter for mass spectrometer
- Patent Title (中): 质谱仪污染过滤器
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Application No.: US14894494Application Date: 2014-06-20
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Publication No.: US09564302B2Publication Date: 2017-02-07
- Inventor: Thomas R. Covey , Bradley B. Schneider
- Applicant: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
- Applicant Address: SG Singapore
- Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Kasha Law LLC
- Agent John R. Kasha; Kelly L. Kasha
- International Application: PCT/IB2014/001143 WO 20140620
- International Announcement: WO2014/203071 WO 20141224
- Main IPC: H01J37/00
- IPC: H01J37/00 ; B01D15/34 ; G01N27/62 ; H01J49/00 ; H01J49/14 ; H01J49/16

Abstract:
Methods and systems for performing mass spectrometry are provided herein. In accordance with various aspects of the applicants' teachings, the methods and systems can utilize an ion mobility spectrometer operating at atmospheric or low-vacuum pressure to remove the major contributors to the contamination and degradation of critical downstream components of a mass spectrometer located within a high-vacuum system (e.g., ion optics, mass filters, detectors), with limited signal loss.
Public/Granted literature
- US20160118234A1 Contamination Filter for Mass Spectrometer Public/Granted day:2016-04-28
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