An alarm system testing device facilitates simulation of a trouble condition and testing circuit continuity of an alarm system within a structure. The device includes an alarm system comprising an electrical circuit, an alarm, a resistor, and at least one trigger. The alarm is activated by the trigger shorting a positive rail of the electrical circuit to a negative rail. A testing switch has a ground position wherein the positive rail of the electrical circuit is grounded when the testing switch is in the ground position. The resistor is electrically coupled to the testing switch such that positioning the testing switch in a resistor bypass position removes the resistor from the electrical circuit.