Invention Grant
- Patent Title: Test system
- Patent Title (中): 测试系统
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Application No.: US14295297Application Date: 2014-06-03
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Publication No.: US09563527B2Publication Date: 2017-02-07
- Inventor: Tomoyuki Yamane
- Applicant: ADVANTEST CORPORATION
- Applicant Address: JP Tokyo
- Assignee: ADVANTEST CORPORATION
- Current Assignee: ADVANTEST CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Cantor Colburn LLP
- Priority: JP2013-118142 20130604
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/263

Abstract:
A server stores multiple configuration data which respectively provide different functions to a test system. A tester hardware is configured to be capable of changing at least a part of its functions according to the configuration data stored in nonvolatile memory included in the tester hardware. A control program is installed on an information processing apparatus. The control program provides the information processing apparatus with (i) a function of displaying multiple configuration data candidates on a display when the test system is set up, and (ii) a function of writing the configuration data selected by the user to the nonvolatile memory of the tester hardware.
Public/Granted literature
- US20140359361A1 TEST SYSTEM Public/Granted day:2014-12-04
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