Invention Grant
- Patent Title: Exposure apparatus and device fabrication method
- Patent Title (中): 曝光装置和装置制造方法
-
Application No.: US14551702Application Date: 2014-11-24
-
Publication No.: US09563133B2Publication Date: 2017-02-07
- Inventor: Kazuya Ono
- Applicant: NIKON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NIKON CORPORATION
- Current Assignee: NIKON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2003-371780 20031031
- Main IPC: G03B27/52
- IPC: G03B27/52 ; G03B27/42 ; G03F7/20

Abstract:
An exposure apparatus includes a projection system; a liquid supply system configured to supply liquid to a space under the projection system; a liquid recovery system configured to recover the supplied liquid via a recovery opening; a separator fluidically connected to the recovery opening, which separates one of the liquid and gas, which has been collected via the recovery opening, from the other; a flow-meter fluidically connected to the recovery opening; a stage system configured to move a movable member on which a substrate is held; and a measurement system having a light receiving part which receives a measurement light through a light-transmissive member provided at the movable member and through the liquid between the projection system and the light-transmissive member.
Public/Granted literature
- US20150077730A1 EXPOSURE APPARATUS AND DEVICE FABRICATION METHOD Public/Granted day:2015-03-19
Information query