Invention Grant
- Patent Title: Methods and systems for characterizing photovoltaic cell and module performance at various stages in the manufacturing process
- Patent Title (中): 在制造过程的各个阶段表征光伏电池和模块性能的方法和系统
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Application No.: US14561667Application Date: 2014-12-05
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Publication No.: US09537444B2Publication Date: 2017-01-03
- Inventor: John M. Schmidt , Gregory S. Horner , Leonid A. Vasilyev , James E. Hudson , Kyle Lu
- Applicant: Tau Science Corporation
- Applicant Address: US OR Hillsboro
- Assignee: Tau Science Corporation
- Current Assignee: Tau Science Corporation
- Current Assignee Address: US OR Hillsboro
- Agency: Lumen Patent Firm
- Main IPC: H02S50/10
- IPC: H02S50/10

Abstract:
A method of quantum efficiency (QE) photovoltaic measurement is provided that includes coupling measurement electronics to a p-n junction of a Cell Under Test (CUT) that are capable of measuring a pulsed DC photocurrent. The measurement electronics output a response by the CUT to turning on and turning off the pulsed DC photocurrent that are digitized and analyzed for the magnitude that is representative of a conversion efficiency of the CUT to a wavelength of the DC photocurrent, where a measured decay time represents the p-n junction or the minority carrier lifetime. The CUT is exposed to the pulsed DC photocurrent, where signatures of the response to turning off and on to the pulsed DC photocurrent overlap, where a combined amplitude of the response is proportional to an efficiency of a production of photocarriers, where a value of a spectral response at a wavelength is determined.
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