Invention Grant
- Patent Title: Temperature detector and controlling heat
- Patent Title (中): 温度检测器和控制热量
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Application No.: US13956838Application Date: 2013-08-01
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Publication No.: US09536876B2Publication Date: 2017-01-03
- Inventor: Yung-Chow Peng , Amit Kundu , Szu-Lin Liu , Jaw-Juinn Horng
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, P.C., Intellectual Property Attorneys
- Agent Anthony King
- Main IPC: G01K7/01
- IPC: G01K7/01 ; H01L29/772 ; H01L29/78 ; H01L23/00 ; H01L27/088 ; H01L27/02 ; H01L23/34 ; H01L29/423 ; H01L29/786
Abstract:
A circuit with a temperature detector includes a first FET and a second FET. Each of the first and second FETs has a channel structure having a non-planar structure. The second FET is in close proximity to the first FET. A gate of the second FET is separated from the first FET, and a source and drain of the second FET are shorted together. A resistance of the gate of the second FET between two terminals on the gate of the second FET varies with a temperature local to the first FET.
Public/Granted literature
- US20150035568A1 TEMPERATURE DETECTOR AND CONTROLLING HEAT Public/Granted day:2015-02-05
Information query
