Invention Grant
- Patent Title: Light activated test connections
- Patent Title (中): 光激活测试连接
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Application No.: US13689090Application Date: 2012-11-29
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Publication No.: US09437670B2Publication Date: 2016-09-06
- Inventor: Nathaniel R. Chadwick , John B. DeForge , John J. Ellis-Monaghan , Jeffrey P. Gambino , Ezra D. Hall , Marc D. Knox , Kirk D. Peterson
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES INC.
- Current Assignee: GLOBALFOUNDRIES INC.
- Current Assignee Address: KY Grand Cayman
- Agency: Roberts Mlotkowski Safran Cole & Calderon, P.C.
- Agent David Cain; Andrew M. Calderon
- Main IPC: G01R31/02
- IPC: G01R31/02 ; H01L29/00 ; H01L21/66 ; G01R31/28
Abstract:
A test circuit including a light activated test connection in a semiconductor device is provided. The light activated test connection is electrically conductive during a test of the semiconductor device and is electrically non-conductive after the test.
Public/Granted literature
- US20140145747A1 LIGHT ACTIVATED TEST CONNECTIONS Public/Granted day:2014-05-29
Information query
