Invention Grant
- Patent Title: Cross-domain electrostatic discharge protection device
- Patent Title (中): 跨域静电放电保护装置
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Application No.: US14849054Application Date: 2015-09-09
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Publication No.: US09437591B1Publication Date: 2016-09-06
- Inventor: Karuna Nidhi , Federico Agustin Altolaguirre , Ming-Dou Ker , Geeng-Lih Lin
- Applicant: Vanguard International Semiconductor Corporation
- Applicant Address: TW Hsinchu
- Assignee: Vanguard International Semiconductor Corporation
- Current Assignee: Vanguard International Semiconductor Corporation
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L27/02 ; H01L29/10 ; H01L27/092 ; H01L49/02 ; H01L27/06

Abstract:
A cross-domain electrostatic protection device having four embedded silicon controlled rectifiers (a QSCR structure) embedded in a single cell. Two grounded-gate NMOS transistors are embedded into the cross-domain electrostatic protection device for reducing trigger voltage of the QSCR structure. Furthermore, an external trigger circuit and a bias circuit are applied to the cross-domain electrostatic protection device to reduce trigger voltage of the QSCR structure and leakage current.
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