Invention Grant
US09437498B2 Method for the formation of different gate metal regions of MOS transistors
有权
用于形成MOS晶体管的不同栅极金属区域的方法
- Patent Title: Method for the formation of different gate metal regions of MOS transistors
- Patent Title (中): 用于形成MOS晶体管的不同栅极金属区域的方法
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Application No.: US14636778Application Date: 2015-03-03
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Publication No.: US09437498B2Publication Date: 2016-09-06
- Inventor: Stéphane Zoll , Philippe Garnier , Olivier Gourhant , Vincent Joseph
- Applicant: STMICROELECTRONICS (CROLLES 2) SAS
- Applicant Address: FR Crolles
- Assignee: STMICROELECTRONICS (CROLLES 2) SAS
- Current Assignee: STMICROELECTRONICS (CROLLES 2) SAS
- Current Assignee Address: FR Crolles
- Agency: Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A.
- Priority: FR1452130 20140314
- Main IPC: H01L21/3205
- IPC: H01L21/3205 ; H01L21/8234 ; H01L29/49 ; H01L21/324 ; H01L21/033 ; H01L21/28

Abstract:
A method is for forming at least two different gates metal regions of at least two MOS transistors. The method may include forming a metal layer on a gate dielectric layer; and forming a metal hard mask on the metal layer, with the hard mask having a composition different from that of the metal layer and covering a first region of the metal layer and leaving open a second region of the metal layer. The method may also include diffusion annealing the intermediate structure obtained in the prior steps such as to make the metal atoms of the hard mask diffuse into the first region, and removal of the hard mask.
Public/Granted literature
- US20150262884A1 METHOD FOR THE FORMATION OF DIFFERENT GATE METAL REGIONS OF MOS TRANSISTORS Public/Granted day:2015-09-17
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