Invention Grant
- Patent Title: Resistance variable memory sensing
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Application No.: US14717784Application Date: 2015-05-20
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Publication No.: US09437294B2Publication Date: 2016-09-06
- Inventor: Ferdinando Bedeschi , Roberto Gastaldi
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G11C13/00
- IPC: G11C13/00

Abstract:
The present disclosure includes apparatuses and methods for sensing a resistance variable memory cell. A number of embodiments include programming a memory cell to an initial data state and determining a data state of the memory cell by applying a programming signal to the memory cell, the programming signal associated with programming memory cells to a particular data state, and determining whether the data state of the memory cell changes from the initial data state to the particular data state during application of the programming signal.
Public/Granted literature
- US20150255152A1 RESISTANCE VARIABLE MEMORY SENSING Public/Granted day:2015-09-10
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