Invention Grant
- Patent Title: Jig and calibration method
- Patent Title (中): 夹具和校准方法
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Application No.: US14220148Application Date: 2014-03-20
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Publication No.: US09436316B2Publication Date: 2016-09-06
- Inventor: Wei-Kuo Kan , Yen-Ting Lin , Yu-Yen Chen , Po-Liang Huang
- Applicant: Wistron Corporation
- Applicant Address: TW New Taipei
- Assignee: Wistron Corporation
- Current Assignee: Wistron Corporation
- Current Assignee Address: TW New Taipei
- Agency: Jianq Chyun IP Office
- Priority: TW102144097A 20131202
- Main IPC: G01S7/41
- IPC: G01S7/41 ; G06F3/041 ; G06F3/042

Abstract:
A jig for calibrating a light transceiver module includes a disposition region for the light transceiver module on which the light transceiver module is suitably disposed and an arc structure, which takes the position of the disposition region for the light transceiver module as a circle center thereof and includes reflective regions, light-absorbing regions and a feature region. The reflective regions and light-absorbing regions are alternately arranged, and the feature region is a region for reflection or for absorbing light. When the feature region is the region for reflection, the width of the region for reflection is different from the width of each the reflective region, and when the feature region is the region for absorbing light, the width of the region for absorbing light is different from width of each of the light-absorbing regions. A calibration method is also provided.
Public/Granted literature
- US20150153899A1 JIG AND CALIBRATION METHOD Public/Granted day:2015-06-04
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