Invention Grant
- Patent Title: Optical angle measurement
- Patent Title (中): 光学角度测量
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Application No.: US13924797Application Date: 2013-06-24
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Publication No.: US09435641B2Publication Date: 2016-09-06
- Inventor: Shrenik Deliwala
- Applicant: Analog Devices, Inc.
- Applicant Address: US MA Norwood
- Assignee: ANALOG DEVICES, INC.
- Current Assignee: ANALOG DEVICES, INC.
- Current Assignee Address: US MA Norwood
- Agency: Patent Capital Group
- Main IPC: G01B11/26
- IPC: G01B11/26

Abstract:
An optical detector may include an epitaxial layer having a continuous surface provided on a surface of a substrate. Two or more electrodes may be arranged at different positions in the epitaxial layer so that the electron-hole pairs generated in the epitaxial layer from incident light passing through the aperture and reaching the epitaxial layer have a varying probability of being collected by each of the electrodes as the angle of the incident light changes. The electrodes may be arranged at different depths in the epitaxial layer. The epitaxial layer may be continuous and have a continuous aperture-facing surface between each of the electrodes associated with a particular aperture to ensure that more light passing through the aperture is absorbable in the epitaxial layer and subsequently detectable by the electrodes. This may result in improved light detection capabilities.
Public/Granted literature
- US20140375985A1 OPTICAL ANGLE MEASUREMENT Public/Granted day:2014-12-25
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