Invention Grant
- Patent Title: Method and system for aligning a point of aim with a point of impact for a projectile device
- Patent Title (中): 将瞄准点与射弹装置的冲击点对准的方法和系统
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Application No.: US14823897Application Date: 2015-08-11
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Publication No.: US09435612B2Publication Date: 2016-09-06
- Inventor: Jack Hancosky
- Applicant: Umarex USA, Inc.
- Applicant Address: US AR Fort Smith
- Assignee: Umarex USA, Inc.
- Current Assignee: Umarex USA, Inc.
- Current Assignee Address: US AR Fort Smith
- Agency: Wintrhop & Weinstine, P.A.
- Main IPC: F41G3/00
- IPC: F41G3/00 ; F41G1/35 ; F41G1/54

Abstract:
A method of aligning a point of aim with a point of impact for a projectile device is disclosed. Using a superposition device coupled to the projectile device, at least one reference point is superposed within a first target area with at least one beam of the superposition device. A position for at least one of the reference points is noted. A projectile is shot from the projectile device at a second target area, while the position of the at least one reference point is maintained, to create the point of impact. The point of aim for the projectile device is adjusted to correspond with the point of impact while the position of the at least one reference points is maintained.
Public/Granted literature
- US20150345905A1 METHOD AND SYSTEM FOR ALIGNING A POINT OF AIM WITH A POINT OF IMPACT FOR A PROJECTILE DEVICE Public/Granted day:2015-12-03
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