Invention Grant
- Patent Title: I-V measurement system for photovoltaic modules
- Patent Title (中): 用于光伏组件的I-V测量系统
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Application No.: US13511087Application Date: 2010-11-30
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Publication No.: US09413174B2Publication Date: 2016-08-09
- Inventor: Michael Gostein , Russell Apfel , Lawrence R. Dunn , Stan Faullin , Naoum Gitnik , Jason Schneider
- Applicant: Michael Gostein , Russell Apfel , Lawrence R. Dunn , Stan Faullin , Naoum Gitnik , Jason Schneider
- Applicant Address: US TX Austin
- Assignee: Atonometrics, Inc.
- Current Assignee: Atonometrics, Inc.
- Current Assignee Address: US TX Austin
- International Application: PCT/US2010/058382 WO 20101130
- International Announcement: WO2011/066554 WO 20110603
- Main IPC: H02J3/38
- IPC: H02J3/38 ; H02S50/10 ; G05F1/67 ; G01R31/26

Abstract:
An apparatus for measuring electrical characteristics of solar panels (photovoltaic modules) wherein the apparatus measures current versus voltage (“I-V”) relationships for both illuminated (“light I-V”) and/or non-illuminated (“dark I-V”) conditions; optionally provides single, dual, or four-quadrant source/sink capability; and measures one or more devices under test (DUTs). The apparatus comprises one or more source measurement units (SMUs), wherein each SMU is connected to one DUT, and optionally includes a positive high-voltage programmable power supply and/or a negative high-voltage programmable power supply. Additionally, the apparatus includes a controller which controls the functions of the SMUs, the high-voltage supplies, and other components of the apparatus, wherein the controller communicates with the SMUs over a signal bus. Finally, the apparatus may include a computer to provide a user interface, communicate with the controller to initiate measurements and record results, analyze resulting data to determine measured parameters, and/or store the measured data.
Public/Granted literature
- US20130181736A1 I-V MEASUREMENT SYSTEM FOR PHOTOVOLTAIC MODULES Public/Granted day:2013-07-18
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