Invention Grant
US09412453B2 Memory system and method of determining a failure in the memory system
有权
存储系统和确定存储器系统故障的方法
- Patent Title: Memory system and method of determining a failure in the memory system
- Patent Title (中): 存储系统和确定存储器系统故障的方法
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Application No.: US14536843Application Date: 2014-11-10
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Publication No.: US09412453B2Publication Date: 2016-08-09
- Inventor: Yoon-Hee Choi , Daeseok Byeon , Byunggil Jeon
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce
- Priority: KR10-2014-0032879 20140320
- Main IPC: G11C16/00
- IPC: G11C16/00 ; G11C16/08 ; G11C8/08 ; G11C8/18 ; G11C29/02 ; G11C29/50 ; G11C16/34 ; G11C29/12

Abstract:
An operating method of a memory system which includes a nonvolatile memory device including memory cells connected to a plurality of word lines, the operating method including pre-charging a selected one of the plurality of word lines; detecting a variation in a voltage or a current on the selected word line after the selected word line is floated; generating runtime failure information according to the detected variation; and determining a state of the selected word line or a state of a memory block including the selected word line, based on the runtime failure information.
Public/Granted literature
- US20150270005A1 MEMORY SYSTEM AND OPERATION METHOD THEREOF Public/Granted day:2015-09-24
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