Invention Grant
- Patent Title: Image processing system and method for object-tracing
- Patent Title (中): 图像处理系统和对象跟踪方法
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Application No.: US14551200Application Date: 2014-11-24
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Publication No.: US09386229B2Publication Date: 2016-07-05
- Inventor: Wen-Yan Chang , Hong-Long Chou , Yi-Hong Tseng , Tsan-Wei Wang , Che-Lun Chuang
- Applicant: ALTEK SEMICONDUCTOR CORPORATION
- Applicant Address: TW Hsinchu
- Assignee: ALTEK SEMICONDUCTOR CORPORATION
- Current Assignee: ALTEK SEMICONDUCTOR CORPORATION
- Current Assignee Address: TW Hsinchu
- Agency: Bacon & Thomas, PLLC
- Priority: TW103135120A 20141009
- Main IPC: H04N5/262
- IPC: H04N5/262 ; H04N5/232

Abstract:
An image processing system and a method for object-tracing are provided. The method includes: receiving a first wide field of view image and a first narrow field of view image, and determining a to-be-traced object therefrom and choosing one image therefrom for serving as a first output image; using an area size of the to-be-traced object in the first output image as a reference area; comparing the reference area with the area sizes of the to-be-traced object from a second wide field of view image and a second narrow field of view image respectively so as to determine one of that as a main image, and respectively zooming and deforming the main image and an area corresponding to the other image, and then fusing a zoomed and deformed second image as a second output image.
Public/Granted literature
- US20160105615A1 IMAGE PROCESSING SYSTEM AND METHOD FOR OBJECT-TRACING Public/Granted day:2016-04-14
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