Invention Grant
- Patent Title: Radiation measurement apparatus
- Patent Title (中): 辐射测量仪
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Application No.: US14348393Application Date: 2012-09-28
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Publication No.: US09383455B2Publication Date: 2016-07-05
- Inventor: Shunichiro Makino , Toru Onodera , Yoshinori Satoh , Naoto Kume
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Minato-ku
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2011-217997 20110930
- International Application: PCT/JP2012/075221 WO 20120928
- International Announcement: WO2013/047824 WO 20130404
- Main IPC: G01T1/17
- IPC: G01T1/17 ; G01T1/172

Abstract:
A radiation measurement apparatus includes a radiation sensor that generates a detection signal, a first counter unit that counts the number of the detection signal, an oscillator that generates periodic signal with predetermined period, an AND circuit that outputs logical product obtained by performing AND operation between the detection signal and the periodic signal, a second counter unit that counts the number of a signal output from the AND circuit, and a display unit that displays a value counted by the first counter unit when a value counted by the second counter unit is less than predetermined value and a value being different from the value counted by the first counter unit when the value counted by the second counter unit is not less than predetermined value.
Public/Granted literature
- US20140231646A1 RADIATION MEASUREMENT APPARATUS Public/Granted day:2014-08-21
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