Invention Grant
- Patent Title: Inductive position-measuring device
- Patent Title (中): 感应位置测量装置
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Application No.: US14105859Application Date: 2013-12-13
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Publication No.: US09383184B2Publication Date: 2016-07-05
- Inventor: Marc Oliver Tiemann , Martin Heumann
- Applicant: DR. JOHANNES HEIDENHAIN GMBH
- Applicant Address: DE Traunreut
- Assignee: DR. JOHANNES HEIDENHAIN GMBH
- Current Assignee: DR. JOHANNES HEIDENHAIN GMBH
- Current Assignee Address: DE Traunreut
- Agency: Kenyon & Kenyon LLP
- Priority: DE102012223037 20121213
- Main IPC: G01B7/14
- IPC: G01B7/14 ; G01B7/00 ; G01D5/20 ; G01D5/245 ; G01B7/30

Abstract:
An inductive position-measuring device includes a scanning element and a graduation element that are movable relative to each other in a first direction. The scanning element includes exciter conductors and three receiver tracks. The first and the second receiver track are disposed at a distance relative to each other, and the third receiver track is located between the first and the second receiver track. The graduation element includes two graduation tracks which are disposed at a distance relative to each other, and which have different graduation periods. Furthermore, electromagnetic fields generated by the exciter conductors are able to be modulated by the graduation tracks, so that a relative position in the first direction is detectable by the first and the second receiver track, while a relative position in a second direction, which is oriented orthogonally with respect to the first direction, is detectable by the third receiver track.
Public/Granted literature
- US20140167746A1 Inductive Position-Measuring Device Public/Granted day:2014-06-19
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