Invention Grant
- Patent Title: Variable resistance device having parallel structure
- Patent Title (中): 具有并联结构的可变电阻装置
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Application No.: US14057919Application Date: 2013-10-18
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Publication No.: US09362419B2Publication Date: 2016-06-07
- Inventor: Hyung Jin Park
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon
- Assignee: SK HYNIX INC.
- Current Assignee: SK HYNIX INC.
- Current Assignee Address: KR Icheon
- Priority: KR10-2013-0050526 20130506
- Main IPC: H01L29/8605
- IPC: H01L29/8605 ; H01L29/66 ; H01L49/02

Abstract:
A variable resistance device includes a parallel structure. The variable resistance device is formed using a silicon (Si) substrate. In the variable resistance device, a conductive line arranged in a current direction is formed over an impurity region, and a resistance value of the resistance device is precisely adjusted by adjusting a level of a voltage applied to the conductive line. The variable resistance device includes a first impurity region formed in a substrate, a second impurity region formed in the substrate and arranged parallel to the first impurity region, a conductive line formed over the first impurity region, and electrode terminals formed at both longitudinal ends of the second impurity region to be coupled to the second impurity region.
Public/Granted literature
- US20140327085A1 VARIABLE RESISTANCE DEVICE HAVING PARALLEL STRUCTURE Public/Granted day:2014-11-06
Information query
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