Invention Grant
- Patent Title: FETs and methods for forming the same
- Patent Title (中): FET及其形成方法
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Application No.: US14485405Application Date: 2014-09-12
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Publication No.: US09362386B2Publication Date: 2016-06-07
- Inventor: Yu-Lien Huang , Chun-Hsiang Fan , Tung Ying Lee , Chi-Wen Liu
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater Matsil, LLP
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L29/04 ; H01L29/78

Abstract:
FETs and methods for forming FETs are disclosed. A structure comprises a substrate, a gate dielectric and a gate electrode. The substrate comprises a fin, and the fin comprises an epitaxial channel region. The epitaxial channel has a major surface portion of an exterior surface. The major surface portion comprising at least one lattice shift, and the at least one lattice shift comprises an inward or outward shift relative to a center of the fin. The gate dielectric is on the major surface portion of the exterior surface. The gate electrode is on the gate dielectric.
Public/Granted literature
- US20150001468A1 FETS AND METHODS FOR FORMING THE SAME Public/Granted day:2015-01-01
Information query
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