Invention Grant
- Patent Title: Apparatus and method for inspecting short circuit defects
- Patent Title (中): 用于检查短路缺陷的装置和方法
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Application No.: US13672031Application Date: 2012-11-08
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Publication No.: US09361820B2Publication Date: 2016-06-07
- Inventor: June-Woo Lee , Jae-Beom Choi , Kwan-Wook Jung , Sung-Soo Choi , Seong-Jun Kim , Guang-Hai Jin , Ga-Young Kim , Jee-Hoon Kim
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Giheung-Gu, Yongin-si, Gyeonggi-do
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Giheung-Gu, Yongin-si, Gyeonggi-do
- Agent Robert E. Bushnell, Esq.
- Priority: KR10-2012-0053155 20120518
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G06F3/045 ; G09G3/00 ; G09G3/32
Abstract:
A method of inspecting a short circuit defect between first wires extending in a first direction and a second direction intersecting the first direction and second wires extending in the first or second direction, the method including inspecting a short circuit defect between the first and second wires by using a potential difference monitored only in the second wires.
Public/Granted literature
- US20130307557A1 APPARATUS AND METHOD FOR INSPECTING SHORT CIRCUIT DEFECTS Public/Granted day:2013-11-21
Information query
