Invention Grant
- Patent Title: Automated defect and optimization discovery
- Patent Title (中): 自动缺陷和优化发现
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Application No.: US14874020Application Date: 2015-10-02
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Publication No.: US09361592B2Publication Date: 2016-06-07
- Inventor: Mark Chamness , Eric Schnegelberger
- Applicant: EMC Corporation
- Applicant Address: US MA Hopkinton
- Assignee: EMC Corporation
- Current Assignee: EMC Corporation
- Current Assignee Address: US MA Hopkinton
- Agency: Van Pelt, Yi & James LLP
- Main IPC: G06N99/00
- IPC: G06N99/00 ; G06N3/08

Abstract:
Performance information and configuration information is received for the plurality of computer systems. The computer systems are grouped into a plurality of clusters based at least in part on the performance information, where the plurality of clusters includes a first cluster and a second cluster. A system configuration associated with the first cluster is automatically identified from the configuration information and is automatically sent to the second cluster.
Public/Granted literature
- US20160026933A1 AUTOMATED DEFECT AND OPTIMIZATION DISCOVERY Public/Granted day:2016-01-28
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