Invention Grant
- Patent Title: Substrate cleaning method, substrate cleaning apparatus and storage medium for cleaning substrate
- Patent Title (中): 基板清洗方法,基板清洗装置和清洁基板的存储介质
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Application No.: US13733370Application Date: 2013-01-03
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Publication No.: US09307653B2Publication Date: 2016-04-05
- Inventor: Kousuke Yoshihara , Keiichi Tanaka , Hiroshi Ichinomiya
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Pearne & Gordon LLP
- Priority: JP2012-000562 20120105
- Main IPC: B08B5/02
- IPC: B08B5/02 ; H05K3/26 ; B08B3/02 ; H01L21/67

Abstract:
A substrate cleaning method is capable of preventing a liquid stream on a substrate from being cut and circuit patterns thereon from being damaged. The substrate cleaning method includes a liquid film forming process that forms a liquid film on an entire substrate surface by supplying a cleaning liquid L from a central portion of the substrate W toward a peripheral portion thereof while rotating the substrate; a drying region forming process that discharges a gas G on the substrate surface and removes the cleaning liquid on the substrate surface; and a residual liquid removing process that removes the cleaning liquid remaining between the circuit patterns by discharging a gas G while moving in a diametrical direction of the substrate.
Public/Granted literature
- US20130174873A1 SUBSTRATE CLEANING METHOD, SUBSTRATE CLEANING APPARATUS AND STORAGE MEDIUM FOR CLEANING SUBSTRATE Public/Granted day:2013-07-11
Information query
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