Test pattern data corresponds to a test pattern including a first pattern area and a second pattern area. In the first pattern area, patterns extending in a second direction are provided in a stepwise manner in correspondence with respective recording elements such that a gap in the second direction is provided between a back end of one of the patterns or each pattern and a front end of the pattern adjacent thereto. In the second pattern area, pattern columns extending in the second direction are provided in a stepwise manner in correspondence with a set of a predetermined number of consecutively provided recording elements such that a gap in the second direction is provided between a back end of one of the pattern columns or each pattern column and a front end of the pattern column adjacent thereto, the predetermined number being two or more consecutively provided recording elements.