Invention Grant
US09275758B2 Error detection circuit and semiconductor integrated circuit using the same
有权
误差检测电路和半导体集成电路使用相同
- Patent Title: Error detection circuit and semiconductor integrated circuit using the same
- Patent Title (中): 误差检测电路和半导体集成电路使用相同
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Application No.: US14188108Application Date: 2014-02-24
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Publication No.: US09275758B2Publication Date: 2016-03-01
- Inventor: Ha Jun Jeong
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2013-0147761 20131129
- Main IPC: G06F13/42
- IPC: G06F13/42 ; G06F11/10 ; H03M13/09 ; G11C29/04 ; G11C29/38
Abstract:
The technology may include: a first error detection operation unit configured to perform a serial error detection operation on a data signal which is inputted in sequence through each of multiple input/output pads, and to generate multiple pieces of preliminary information; and a second error detection operation unit configured to perform a parallel error detection operation on the multiple pieces of preliminary information, and to generate an error detection code.
Public/Granted literature
- US20150155057A1 ERROR DETECTION CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT USING THE SAME Public/Granted day:2015-06-04
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