Invention Grant
US09275747B2 Integrated circuit with automatic total ionizing dose (TID) exposure deactivation
有权
具有自动总电离剂量（TID）曝光去激活的集成电路
- Patent Title: Integrated circuit with automatic total ionizing dose (TID) exposure deactivation
- Patent Title (中): 具有自动总电离剂量（TID）曝光去激活的集成电路
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Application No.: US13517730Application Date: 2012-06-14
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Publication No.: US09275747B2Publication Date: 2016-03-01
- Inventor: Robert Christopher Baumann , John Michael Carulli, Jr.
- Applicant: Robert Christopher Baumann , John Michael Carulli, Jr.
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Jacqueline J. Garner; Frank D. Cimino
- Main IPC: H01H35/00
- IPC: H01H35/00 ; H01H83/00 ; G11C16/26 ; G11C16/22 ; G11C7/24 ; G11C8/20
Abstract:
Integrated circuits and methods for deactivating user circuit operation with one or more wide channel sensing transistors biased to an on condition for exposure to total ionizing dose and then to an off condition for measurement and comparison of a leakage current or threshold voltage parameter to a predetermined reference, and a deactivation circuit selectively disables operation of the user circuit if the sensed parameter is greater than or equal to the reference.
Public/Granted literature
- US20130334897A1 INTEGRATED CIRCUIT WITH AUTOMATIC TOTAL IONIZING DOSE (TID) EXPOSURE DEACTIVATION Public/Granted day:2013-12-19
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