Invention Grant
- Patent Title: Goodness of fit based on error calculation and fit type
- Patent Title (中): 基于误差计算和拟合类型的拟合度
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Application No.: US13873474Application Date: 2013-04-30
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Publication No.: US09275484B2Publication Date: 2016-03-01
- Inventor: Timothy James Wessman , Gregory Thorn Springer
- Applicant: Hewlett-Packard Development Company, L. P.
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Agency: Hewlett-Packard Legal Dept.
- Main IPC: G06T11/20
- IPC: G06T11/20 ; G06F17/18
Abstract:
Examples disclose selecting an error calculation corresponding to a measure of goodness of fit and identifying a fit type among multiple fit types based on the selected error calculation. The identified fit type indicates a better fit type of goodness of fit than the multiple fit types. The examples further disclose providing the goodness of fit based on the selected error calculation and the identified fit type.
Public/Granted literature
- US20140320501A1 GOODNESS OF FIT BASED ON ERROR CALCULATION AND FIT TYPE Public/Granted day:2014-10-30
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