Invention Grant
- Patent Title: Method and system for testing semiconductor device
- Patent Title (中): 半导体器件测试方法和系统
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Application No.: US14556019Application Date: 2014-11-28
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Publication No.: US09274162B2Publication Date: 2016-03-01
- Inventor: Kie-Bong Ku , Lee-Bum Lee
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2010-0129946 20101217
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G11C29/08 ; G11C29/44 ; G11C29/50 ; G01R31/28
Abstract:
A method for testing a semiconductor device includes testing the semiconductor device in a plurality of operation modes sequentially, and programming the semiconductor device to operate in at least one of the operation modes when the semiconductor device passes the testing.
Public/Granted literature
- US20150084665A1 METHOD AND SYSTEM FOR TESTING SEMICONDUCTOR DEVICE Public/Granted day:2015-03-26
Information query
