Invention Grant
US09274107B2 Microchip, measurement system and method using the same, and test reagent to be used for microchip 有权
Microchip的测量系统和使用该仪器的方法以及用于微芯片的测试试剂

  • Patent Title: Microchip, measurement system and method using the same, and test reagent to be used for microchip
  • Patent Title (中): Microchip的测量系统和使用该仪器的方法以及用于微芯片的测试试剂
  • Application No.: US13474863
    Application Date: 2012-05-18
  • Publication No.: US09274107B2
    Publication Date: 2016-03-01
  • Inventor: Shun Momose
  • Applicant: Shun Momose
  • Applicant Address: JP Kyoto
  • Assignee: Rohm Co., Ltd.
  • Current Assignee: Rohm Co., Ltd.
  • Current Assignee Address: JP Kyoto
  • Agency: Fish & Richardson P.C.
  • Priority: JP2011-113587 20110520; JP2011-113588 20110520
  • Main IPC: G01N33/543
  • IPC: G01N33/543 G01N21/03 G01N21/07
Microchip, measurement system and method using the same, and test reagent to be used for microchip
Abstract:
A microchip to be used for measuring a plurality of types of objects to be measured. The microchip includes at least a reagent retaining portion and a detecting portion. The test reagent retaining portion includes a plurality of types of test reagents corresponding respectively to the plurality of types of objects to be measured. A plurality of time courses for a change in detected value at the detecting portion caused by a reaction between the test reagents and the objects to be measured corresponding respectively thereto are all different from each other.
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