Invention Grant
US09274104B2 Measuring system using optical waveguide, measuring device, measuring method, optical waveguide type sensor chip, and magnetic fine particle
有权
使用光波导的测量系统，测量装置，测量方法，光波导型传感器芯片和磁性细颗粒
- Patent Title: Measuring system using optical waveguide, measuring device, measuring method, optical waveguide type sensor chip, and magnetic fine particle
- Patent Title (中): 使用光波导的测量系统，测量装置，测量方法，光波导型传感器芯片和磁性细颗粒
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Application No.: US13436115Application Date: 2012-03-30
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Publication No.: US09274104B2Publication Date: 2016-03-01
- Inventor: Ichiro Tono , Shingo Kasai , Takaaki Wada , Isao Nawata , Masaaki Hirakawa , Tomohiro Takase , Kayoko Oomiya , Takeshi Yamauchi , Tadahiro Nakayama , Isamu Nitta
- Applicant: Ichiro Tono , Shingo Kasai , Takaaki Wada , Isao Nawata , Masaaki Hirakawa , Tomohiro Takase , Kayoko Oomiya , Takeshi Yamauchi , Tadahiro Nakayama , Isamu Nitta
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2011-076412 20110330; JP2011-201221 20110914; JP2012-011456 20120123
- Main IPC: G01N15/06
- IPC: G01N15/06 ; G01N27/00 ; G01N33/543 ; G01N33/58
Abstract:
According to one embodiment, a measuring system using an optical waveguide is provided. The measuring system has an optical waveguide, magnetic fine particles, a magnetic field applying unit, a light source and a light receiving element. The optical waveguide has a sensing area to which first substances having a property of specifically bonding to subject substances to be measured are fixed. Second substances having a property of specifically bonding to the subject substances are fixed to the magnetic fine particle. The magnetic field applying unit generates a magnetic field for moving the magnetic fine particles. The light source inputs a light into the optical waveguide. The light receiving element receives the light output from the optical waveguide.
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