Invention Grant
US09273957B2 Method and apparatus for calibrating a sensor for the measurement of material thickness or surface weight
有权
用于校准用于测量材料厚度或表面重量的传感器的方法和装置
- Patent Title: Method and apparatus for calibrating a sensor for the measurement of material thickness or surface weight
- Patent Title (中): 用于校准用于测量材料厚度或表面重量的传感器的方法和装置
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Application No.: US13422388Application Date: 2012-03-16
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Publication No.: US09273957B2Publication Date: 2016-03-01
- Inventor: Helmut Knorr
- Applicant: Helmut Knorr
- Agency: Peters Verny, LLP
- Priority: DE102011014518 20110318
- Main IPC: G01B21/08
- IPC: G01B21/08 ; G01B11/06 ; G01B17/02

Abstract:
A method is provided for calibrating a sensor used for surface weight measurement or thickness measurement on a material sheet via transmission measurement and/or reflection measurement. The method may include: providing a two-dimensional calibration sample with a known surface weight; detection of the transmission values and/or the reflection values of the calibration sample via the sensor on a plurality of different positions two-dimensionally or areally distributed across the surface of the calibration sample; and the detection of the calibration value for the sensor via calculation of average from the plurality detected transmission values and/or reflection values and the composition of the average transmission and reflection values with the known surface weight of the calibration sample. Also provided is a method for measurement of layer thickness and/or surface weight of material sheets using the calibration method, as well as an apparatus for layer thickness measurements and/or surface weight measurement.
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