Invention Grant
US09252246B2 Integrated split gate non-volatile memory cell and logic device 有权
集成分离门非易失性存储单元和逻辑器件

Integrated split gate non-volatile memory cell and logic device
Abstract:
A method of making a semiconductor structure includes forming a select gate and a charge storage layer in an NVM region. A control gate is formed by depositing a conformal layer followed by an etch back. A patterned etch results in leaving a portion of the charge storage layer over the select gate and under the control gate and to remove the charge storage layer from the logic region. A logic gate structure formed in a logic region has a metal work function surrounded by an insulating layer.
Public/Granted literature
Information query
Patent Agency Ranking
0/0