Invention Grant
- Patent Title: Integrated split gate non-volatile memory cell and logic device
- Patent Title (中): 集成分离门非易失性存储单元和逻辑器件
-
Application No.: US13972372Application Date: 2013-08-21
-
Publication No.: US09252246B2Publication Date: 2016-02-02
- Inventor: Asanga H. Perera , Cheong Min Hong , Sung-Taeg Kang , Jane A. Yater
- Applicant: Asanga H. Perera , Cheong Min Hong , Sung-Taeg Kang , Jane A. Yater
- Applicant Address: US TX Austin
- Assignee: FREESCALE SEMICONDUCTOR, INC.
- Current Assignee: FREESCALE SEMICONDUCTOR, INC.
- Current Assignee Address: US TX Austin
- Main IPC: H01L21/336
- IPC: H01L21/336 ; H01L29/66 ; H01L21/28 ; H01L29/423 ; H01L27/115

Abstract:
A method of making a semiconductor structure includes forming a select gate and a charge storage layer in an NVM region. A control gate is formed by depositing a conformal layer followed by an etch back. A patterned etch results in leaving a portion of the charge storage layer over the select gate and under the control gate and to remove the charge storage layer from the logic region. A logic gate structure formed in a logic region has a metal work function surrounded by an insulating layer.
Public/Granted literature
- US20150054050A1 INTEGRATED SPLIT GATE NON-VOLATILE MEMORY CELL AND LOGIC DEVICE Public/Granted day:2015-02-26
Information query
IPC分类: